Evolution of hot carrier dynamics in graphene with the Fermi level tuned across the Dirac point

Kuan-Chun Lin, Ming-Yang Li, D. C. Ling, C. C. Chi, and Jeng-Chung Chen
Phys. Rev. B 91, 125440 – Published 30 March 2015

Abstract

The ultrafast dynamics of photoexcited carriers closely depends on the excitation processes pertaining to the energy band of the materials and the relevant relaxation pathway relies on the interactions between hot carriers and lattice phonons. By using ultrafast optical-pump terahertz (THz)-probe spectroscopy with an ion-gel gate to tune the Fermi energy level EF in graphene, we are able to reveal the relaxation dynamics of hot carriers at different EF. It is found that the relaxation time increases while the pump-induced differential transmission decreases as EF approaches the Dirac point. Through self-consistent model calculations, we quantitatively interpret that a temperature-dependent scattering rate is responsible for a negative photoinduced conductivity, and the relaxation transient directly manifests the Dirac spectrum dependence of the optical phonon emission and the carrier scattering rate. More interestingly, the scattering rate of hot carriers also exhibits a strong EF dependence, which is the most likely to originate from charged impurities inevitably present in graphene. The diminution of photoresponse efficiency across the Dirac point implies that the graphene-based optoelectronic devices may be operable only in the highly doped regime.

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  • Received 25 April 2014
  • Revised 17 March 2015

DOI:https://doi.org/10.1103/PhysRevB.91.125440

©2015 American Physical Society

Authors & Affiliations

Kuan-Chun Lin1, Ming-Yang Li1, D. C. Ling2, C. C. Chi1,3, and Jeng-Chung Chen1,3

  • 1Department of Physics, National Tsing-Hua University, Hsinchu, 30013, Taiwan
  • 2Department of Physics, Tamkang University, Tamsui Dist., New Taipei City 25137, Taiwan
  • 3Frontier Research Center on Fundamental and Applied Sciences of Matters, National Tsing Hua University, Hsinchu, 30013, Taiwan

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Vol. 91, Iss. 12 — 15 March 2015

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