Abstract
We address the origin of beadlike edge states observed by scanning tunneling microscopy (STM) in moiré patterns of graphite. Low-bias STM measurements indicate these edge states are centered around stacking sites, contrary to the common assumption of them being at sites. This shift in the beads intensity with respect to the bulk moiré pattern has been corroborated by a tight-binding calculation of the edge states in bilayer flakes. Our results are valid not only for graphite, but also for few-layer graphene where these states have also been recently observed.
- Received 9 September 2014
- Revised 23 December 2014
DOI:https://doi.org/10.1103/PhysRevB.91.035441
©2015 American Physical Society