Abstract
We determine the magnetic and magnetotransport properties of 33 nm thick films epitaxially deposited by rf-magnetron sputtering on unpoled (011) (PMN-PT) substrates. The magnetoresistance (MR), as well as the magnetization reversal, strongly depend on the in-plane crystallographic direction of the epitaxial (011) film and strain. When the magnetic field is applied along [100], the magnetization loops are slanted and the sign of the longitudinal MR changes from positive to negative around the Verwey transition at 125 K on cooling. Along the direction, the loops are square shaped and the MR is negative above the switching field across the whole temperature range, just increasing in absolute value when cooling from 300 K to 150 K. The value of the MR is found to be strongly affected by poling the PMN-PT substrate, decreasing in the [100] direction and slightly increasing in the direction upon poling, which results in a strained film.
- Received 2 February 2014
- Revised 17 December 2014
DOI:https://doi.org/10.1103/PhysRevB.91.024405
©2015 American Physical Society