Noncollinear Andreev reflections in semiconductor nanowires

B. H. Wu, W. Yi, J. C. Cao, and G.-C. Guo
Phys. Rev. B 90, 205435 – Published 25 November 2014

Abstract

We show that noncollinear Andreev reflections can be induced at interfaces of semiconductor nanowires with spin-orbit coupling, Zeeman splitting, and proximity-induced superconductivity. In a noncollinear local Andreev reflection, the spin polarizations of the injected and the retro-reflected carriers are typically at an angle that is tunable via system parameters. While in a nonlocal transport, this noncollinearity enables us to identify and block, at different voltage configurations, the noncollinear cross Andreev reflection and the direct charge transfer processes. We demonstrate that the intriguing noncollinearity originates from the spin-dependent coupling between carriers in the lead and the lowest discrete states in the wire, which, for a topological superconducting nanowire, are related to the overlap-induced hybridization of Majorana edge states in a finite system. These interesting phenomena can be observed in semiconductor nanowires of experimentally relevant lengths, and are potentially useful for spintronics.

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  • Received 1 April 2014
  • Revised 24 October 2014

DOI:https://doi.org/10.1103/PhysRevB.90.205435

©2014 American Physical Society

Authors & Affiliations

B. H. Wu1,*, W. Yi2,3,†, J. C. Cao4, and G.-C. Guo2,3

  • 1Department of Applied Physics, Donghua University, 2999 North Renmin Road, Shanghai 201620, China
  • 2Key Laboratory of Quantum Information, University of Science and Technology of China, CAS, Hefei, Anhui 230026, People's Republic of China
  • 3Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, China
  • 4Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, China

  • *bhwu2010@gmail.com
  • wyiz@ustc.edu.cn

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Issue

Vol. 90, Iss. 20 — 15 November 2014

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