Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth

C. Frank, R. Banerjee, M. Oettel, A. Gerlach, J. Novák, G. Santoro, and F. Schreiber
Phys. Rev. B 90, 205401 – Published 5 November 2014

Abstract

Understanding the growth of organic semiconducting molecules with shape anisotropy is of high relevance to the processing of optoelectronic devices. This work provides insight into the growth of thin films of the prototypical rodlike organic semiconductor diindenoperylene on a microscopic level by analyzing in detail the film morphology. We model our data, which were obtained by high-resolution grazing incidence small-angle x-ray scattering, using a theoretical description from small-angle scattering theory derived for simple liquids. Based on form-factor calculations for different object types, we determine how the island shapes change in the respective layers. Atomic force microscopy measurements approve our findings.

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  • Received 11 August 2014
  • Revised 9 October 2014

DOI:https://doi.org/10.1103/PhysRevB.90.205401

©2014 American Physical Society

Authors & Affiliations

C. Frank1, R. Banerjee1, M. Oettel1, A. Gerlach1, J. Novák2, G. Santoro3, and F. Schreiber1

  • 1Institut für Angewandte Physik, Universität Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany
  • 2Central European Institute of Technology, Masaryk University, Kamenice 5, CZ-62500 Brno, Czech Republic
  • 3Photon Science, DESY, Notkestrasse 85, 22607 Hamburg, Germany

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Vol. 90, Iss. 20 — 15 November 2014

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