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Ballistic- and quantum-conductor carbon nanotubes: A reference experiment put to the test

M. Kobylko, M. Kociak, Y. Sato, K. Urita, A. M. Bonnot, A. Kasumov, Y. Kasumov, K. Suenaga, and C. Colliex
Phys. Rev. B 90, 195431 – Published 20 November 2014
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Abstract

We have performed electrical transport experiments on individual carbon nanotubes (CNTs) in situ in a transmission electron microscope using the liquid-metal contact method (LMC method), which consists of immersing a CNT placed on the apex of a metallic tip into a drop of liquid mercury (Hg). In the literature, this method has been mostly employed without visualization (ex situ) to show the ballistic- and quantum-conductance properties of different kinds of CNTs. We show that on the one hand the in situ LMC method is well suited to create low-resistance contacts with the CNTs but on the other hand the ballistic and quantum conductance measured by the ex situ LMC method is likely to give false positives for three reasons: (a) the CNTs are likely to be removed from the tip surface through contact with the Hg, (b) occurring Hg-tip surface nanocontacts are likely to be mistaken for quantum-conductor CNTs, and (c) occurring Hg nanomenisci are likely to be mistaken for ballistic-conductor CNTs. These findings have strong consequences for the interpretation of previously reported works.

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  • Received 13 March 2014

DOI:https://doi.org/10.1103/PhysRevB.90.195431

©2014 American Physical Society

Authors & Affiliations

M. Kobylko1,2, M. Kociak1, Y. Sato3, K. Urita3,4, A. M. Bonnot5, A. Kasumov1,6, Y. Kasumov6, K. Suenaga3, and C. Colliex1

  • 1Laboratoire de Physique des Solides (LPS), CNRS/Université Paris-Sud UMR 8502, Bâtiment 510, Orsay, France
  • 2Laboratoire des Solides Irradiés (LSI), CEA/CNRS/Ecole Polytechnique UMR 7642, Ecole Polytechnique, Palaiseau, France
  • 3Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
  • 4Graduate School of Engineering, Nagasaki University, Nagasaki, Japan
  • 5Institut Louis Néel, CNRS/UJF UPR 2940, BP 166, Grenoble, France
  • 6Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences (IMT-RAS), Chernogolovka, Moscow Region, Russia

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Issue

Vol. 90, Iss. 19 — 15 November 2014

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