Hyperfine Stark effect of shallow donors in silicon

Giuseppe Pica, Gary Wolfowicz, Matias Urdampilleta, Mike L. W. Thewalt, Helge Riemann, Nikolai V. Abrosimov, Peter Becker, Hans-Joachim Pohl, John J. L. Morton, R. N. Bhatt, S. A. Lyon, and Brendon W. Lovett
Phys. Rev. B 90, 195204 – Published 18 November 2014

Abstract

We present a complete theoretical treatment of Stark effects in bulk doped silicon, whose predictions are supported by experimental measurements. A multivalley effective mass theory, dealing nonperturbatively with valley-orbit interactions induced by a donor-dependent central cell potential, allows us to obtain a very reliable picture of the donor wave function within a relatively simple framework. Variational optimization of the 1s donor binding energies calculated with a new trial wave function, in a pseudopotential with two fitting parameters, allows an accurate match of the experimentally determined donor energy levels, while the correct limiting behavior for the electronic density, both close to and far from each impurity nucleus, is captured by fitting the measured contact hyperfine coupling between the donor nuclear and electron spin. We go on to include an external uniform electric field in order to model Stark physics: with no extra ad hoc parameters, variational minimization of the complete donor ground energy allows a quantitative description of the field-induced reduction of electronic density at each impurity nucleus. Detailed comparisons with experimental values for the shifts of the contact hyperfine coupling reveal very close agreement for all the donors measured (P, As, Sb, and Bi). Finally, we estimate field ionization thresholds for the donor ground states, thus setting upper limits to the gate manipulation times for single qubit operations in Kane-like architectures: the Si:Bi system is shown to allow for A gates as fast as 10 MHz.

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  • Received 8 September 2014
  • Revised 29 October 2014

DOI:https://doi.org/10.1103/PhysRevB.90.195204

©2014 American Physical Society

Authors & Affiliations

Giuseppe Pica1,*, Gary Wolfowicz2,3, Matias Urdampilleta2, Mike L. W. Thewalt4, Helge Riemann5, Nikolai V. Abrosimov5, Peter Becker6, Hans-Joachim Pohl7, John J. L. Morton2,8, R. N. Bhatt9, S. A. Lyon9, and Brendon W. Lovett1,3,*

  • 1SUPA, School of Physics and Astronomy, University of St Andrews, KY16 9SS, United Kingdom
  • 2London Centre for Nanotechnology, University College London, London WC1H 0AH, United Kingdom
  • 3Department of Materials, Oxford University, Oxford OX1 3PH, United Kingdom
  • 4Department of Physics, Simon Fraser University, Burnaby, British Columbia V5A 1S6, Canada
  • 5Institute for Crystal Growth, Max-Born Strasse 2, D-12489 Berlin, Germany
  • 6Physikalisch-Tecnische Bundesanstalt, D-38116 Braunschweig, Germany
  • 7Vitcon Projectconsult GmbH, 07745 Jena, Germany
  • 8Department of Electronic & Electrical Engineering, University College London, London WC1E 7JE, United Kingdom
  • 9Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA

  • *Corresponding authors: gp46@st-andrews.ac.uk and bwl4@st-andrews.ac.uk

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Issue

Vol. 90, Iss. 19 — 15 November 2014

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