Pseudospin dynamics of exciton-polariton patterns in a coherently driven semiconductor microcavity

Albrecht Werner, Oleg A. Egorov, and Falk Lederer
Phys. Rev. B 90, 165308 – Published 23 October 2014

Abstract

The influence of the exciton spin on the formation and stability properties of periodic cavity polariton patterns is studied in a semiconductor microcavity operating in the strong-coupling regime. A linearly polarized optical beam excites polaritons formed by excitons with different spin orientations and left- and right-circularly polarized photons. The perturbation analysis of homogeneous solutions reveals a competition between these two spin states. The outcome of this competition is determined by the sign of the cross-phase modulation parameter. In particular, it is shown that linearly polarized patterns are preferred, if this parameter is positive. Otherwise, a spontaneous symmetry-breaking instability leads to the formation of transverse patterns with a spatial polarization asymmetry. In the regime of bistable homogeneous solutions we observe the spontaneous formation of domains framed by one-dimensional dark half solitons.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
1 More
  • Received 11 July 2014
  • Revised 2 October 2014

DOI:https://doi.org/10.1103/PhysRevB.90.165308

©2014 American Physical Society

Authors & Affiliations

Albrecht Werner, Oleg A. Egorov, and Falk Lederer

  • Institute of Condensed Matter Theory and Solid State Optics, Abbe Center of Photonics, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, 07743 Jena, Germany

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 90, Iss. 16 — 15 October 2014

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×