Detecting magnetic flux distributions in superconductors with polarized x rays

Claudia Stahl, Patrick Audehm, Joachim Gräfe, Stephen Ruoß, Markus Weigand, Mathias Schmidt, Sebastian Treiber, Michael Bechtel, Eberhard Goering, Gisela Schütz, and Joachim Albrecht
Phys. Rev. B 90, 104515 – Published 19 September 2014

Abstract

The magnetic flux distribution arising from a high-Tc superconductor is detected and visualized using polarized x rays. Therefore, we introduce a sensor layer, namely, an amorphous, soft-magnetic Co40Fe40B20 cover layer, providing a large x-ray magnetic circular dichroism (XMCD). Temperature-dependent XMCD spectroscopy on the magnetic layer has been performed. Exploiting the temperature dependence of the critical current density of the superconductor we find a quantitative correlation between the XMCD signal and the in-plane stray field of the superconductor. Magneto-optical Kerr effect experiments on the sensor layer can simulate the stray field of the superconductor and hence verify the correlation. We show that the XMCD contrast in the sensor layer corresponds to the in-plane magnetic flux distribution of the superconductor and can hence be used to image magnetic structures in superconductors.

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  • Received 5 June 2014
  • Revised 3 September 2014

DOI:https://doi.org/10.1103/PhysRevB.90.104515

©2014 American Physical Society

Authors & Affiliations

Claudia Stahl*, Patrick Audehm, Joachim Gräfe, Stephen Ruoß, Markus Weigand, Mathias Schmidt, Sebastian Treiber, Michael Bechtel, Eberhard Goering, and Gisela Schütz

  • Max Planck Institute for Intelligent Systems, Heisenbergstraße 3, 70569 Stuttgart, Germany

Joachim Albrecht

  • Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstraße 1, 73430 Aalen, Germany

  • *stahl@is.mpg.de

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Issue

Vol. 90, Iss. 10 — 1 September 2014

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