Polarization-controlled spin reorientation transition and resistive switching in ferromagnetic-ferroelectric nanostructures and tunnel junctions

N. A. Pertsev, G. Viaud, and B. Dkhil
Phys. Rev. B 90, 024426 – Published 28 July 2014

Abstract

A spin reorientation transition (SRT) induced in a ferromagnetic nanolayer by the polarization switching in an adjoining ferroelectric film or bulk crystal is described theoretically. It is shown that such a polarization-controlled SRT can be realized in a narrow range of the nanolayer thicknesses only. Our calculations allowing for the polarization-dependent interfacial magnetic anisotropy predict that this “thickness window” is located between two threshold thicknesses, at which a size-induced SRT takes place in the ferromagnetic nanolayer at two different directions of the ferroelectric polarization. Importantly, the polarization-controlled SRT manifests itself in the resistance switching occurring in multiferroic tunnel junctions (MFTJs), where an ultrathin ferroelectric barrier is embedded between a ferromagnetic electrode with controllable magnetization and an electrode with a fixed magnetization. Using Fe/BaTiO3/Fe junctions as a representative example, we demonstrate that such MFTJs can be employed as electric-write nanoscale memory cells with reliable nondestructive readout and high thermal stability of information storage.

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  • Received 9 May 2014
  • Revised 17 June 2014

DOI:https://doi.org/10.1103/PhysRevB.90.024426

©2014 American Physical Society

Authors & Affiliations

N. A. Pertsev1,*, G. Viaud2, and B. Dkhil3

  • 1A. F. Ioffe Physical-Technical Institute of the Russian Academy of Sciences and St. Petersburg State Polytechnical University, St. Petersburg, Russia
  • 2Laboratoire Mathématiques Appliquées aux Systèmes, École Centrale Paris, 92295 Châtenay-Malabry, France
  • 3Laboratoire Structures, Propriétés et Modélisation des Solides, UMR8580 CNRS - École Centrale Paris, 92295 Châtenay-Malabry, France

  • *Corresponding author: pertsev.domain@mail.ioffe.ru

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Issue

Vol. 90, Iss. 2 — 1 July 2014

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