Abstract
A spin reorientation transition (SRT) induced in a ferromagnetic nanolayer by the polarization switching in an adjoining ferroelectric film or bulk crystal is described theoretically. It is shown that such a polarization-controlled SRT can be realized in a narrow range of the nanolayer thicknesses only. Our calculations allowing for the polarization-dependent interfacial magnetic anisotropy predict that this “thickness window” is located between two threshold thicknesses, at which a size-induced SRT takes place in the ferromagnetic nanolayer at two different directions of the ferroelectric polarization. Importantly, the polarization-controlled SRT manifests itself in the resistance switching occurring in multiferroic tunnel junctions (MFTJs), where an ultrathin ferroelectric barrier is embedded between a ferromagnetic electrode with controllable magnetization and an electrode with a fixed magnetization. Using junctions as a representative example, we demonstrate that such MFTJs can be employed as electric-write nanoscale memory cells with reliable nondestructive readout and high thermal stability of information storage.
- Received 9 May 2014
- Revised 17 June 2014
DOI:https://doi.org/10.1103/PhysRevB.90.024426
©2014 American Physical Society