Spectral frustration and spatial coherence in thermal near-field spectroscopy

Brian T. O'Callahan, William E. Lewis, Andrew C. Jones, and Markus B. Raschke
Phys. Rev. B 89, 245446 – Published 30 June 2014

Abstract

Scattering scanning near-field microscopy recently provided spectroscopic access to the fundamentally distinct spatial, spectral, and coherence properties of the thermal near field. Using SiC as an example, we study its thermal surface phonon polariton (SPhP) response. In contrast to the strongly surface-confined thermal near field of localized vibrational modes, an extended exponential distance dependence is observed reflecting the spatial coherence of the SPhP thermal field. In addition, we observe pronounced spectral frustration with spectral shifts ranging from 5 to 50 cm1 that cannot be explained by conventional tip-sample dipole coupling alone. We present an alternative model describing an effective medium change by the tip. The results highlight the possibility for local spectral and spatial tuning of the thermal SPhP resonance for control of the light-matter interaction using thermal near-field radiation.

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  • Received 28 January 2014
  • Revised 29 May 2014

DOI:https://doi.org/10.1103/PhysRevB.89.245446

©2014 American Physical Society

Authors & Affiliations

Brian T. O'Callahan, William E. Lewis, Andrew C. Jones, and Markus B. Raschke*

  • Department of Physics, Department of Chemistry, and JILA, University of Colorado, Boulder, Colorado 80309, USA

  • *Corresponding author: markus.raschke@colorado.edu

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Issue

Vol. 89, Iss. 24 — 15 June 2014

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