Abstract
Polarization-controlled synchrotron radiation was used to map the electronic structure of buried conducting interfaces of LaAlO/SrTiO in a resonant angle-resolved photoemission experiment. A strong polarization dependence of the Fermi surface and band dispersions is demonstrated, highlighting different Ti orbitals involved in two-dimensional (2D) conduction. Measurements on samples with different doping levels reveal different band occupancies and Fermi-surface areas. The photoemission results are directly compared with advanced first-principles calculations, carried out for different -band filling levels connected with the 2D mobile carrier concentrations obtained from transport measurements, with indication of charge localization at the interface.
- Received 17 July 2013
- Revised 11 March 2014
DOI:https://doi.org/10.1103/PhysRevB.89.121412
©2014 American Physical Society