Topological confinement in trilayer graphene

S. H. R. de Sena, J. M. Pereira, Jr., F. M. Peeters, and G. A. Farias
Phys. Rev. B 89, 035420 – Published 16 January 2014

Abstract

We calculate the spectrum of states that are localized at the interface between two regions of opposite bias in trilayer graphene (TLG). These potential profiles, also known as potential kinks, have been predicted to support two different branches of localized states for the case of bilayer graphene, and show similarities to the surface states of topological insulators. On the other hand, we found that ABC stacked TLG exhibits three different unidimensional branches of states in each valley that are confined to the kink interface. They have the property E(ky)=E(ky) when belonging to the same valley and EK(ky)=EK(ky). A kink-antikink potential profile opens a gap in the spectrum of these one-dimensional states.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 4 September 2013
  • Revised 2 January 2014

DOI:https://doi.org/10.1103/PhysRevB.89.035420

©2014 American Physical Society

Authors & Affiliations

S. H. R. de Sena1,*, J. M. Pereira, Jr.2,†, F. M. Peeters3,2,‡, and G. A. Farias2,§

  • 1Universidade da Integração Internacional da Lusofonia Afro-Brasileira, Campus da Liberdade, Redenção, Ceará, 62790-000, Brazil
  • 2Departamento de Física, Universidade Federal do Ceará, Fortaleza, Ceará, 60455-760, Brazil
  • 3Department of Physics, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerpen, Belgium

  • *silviahelena@fisica.ufc.br
  • pereira@fisica.ufc.br
  • francois.peeters@uantwerpen.be
  • §gil@fisica.ufc.br

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 89, Iss. 3 — 15 January 2014

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×