Silicene-derived phases on Ag(111) substrate versus coverage: Ab initio studies

P. Pflugradt, L. Matthes, and F. Bechstedt
Phys. Rev. B 89, 035403 – Published 6 January 2014

Abstract

Silicene is systematically investigated as an epitaxial overlayer on an Ag(111) substrate based on the ab initio density functional theory. The geometry and stability of five silicene-silver adsorbate systems with four coincidence lattices, 7×7 on 13×13, 3×3 on 4×4, 2×2 on 7×7, and 7×7 on 23×23, are related to the Si coverage, biaxial strain, and preparation conditions. Their phase diagram is calculated for varying chemical potential of the Si reservoir. The scanning tunneling microscopy images calculated for the optimized atomic geometries agree with those observed experimentally. The destruction of the original honeycomb symmetry and the strong adsorbate-substrate interaction significantly influence the electronic structure. Four peeled-off silicene sheets show conical linear bands, with small gaps. However, the band edges of the 3×3 on 4×4 geometry cannot be explained in terms of gap opening between Dirac cones for symmetry reasons. We confirm the conclusion that the linear bands observed by ARPES are due to folded Ag bands.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 14 October 2013

DOI:https://doi.org/10.1103/PhysRevB.89.035403

©2014 American Physical Society

Authors & Affiliations

P. Pflugradt, L. Matthes, and F. Bechstedt

  • Institut für Festkörpertheorie und -optik, Friedrich-Schiller-Universität, Max-Wien-Platz 1, 07743 Jena, Germany

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 89, Iss. 3 — 15 January 2014

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×