Origin of the energy gap in the narrow-gap semiconductor FeSb2 revealed by high-pressure magnetotransport measurements

H. Takahashi, R. Okazaki, I. Terasaki, and Y. Yasui
Phys. Rev. B 88, 165205 – Published 24 October 2013

Abstract

To elucidate an origin of the two energy gaps in the narrow-gap semiconductor FeSb2, we have investigated the effects of hydrostatic pressure on the resistivity, Hall resistance, and magnetoresistance at low temperatures. The larger energy gap evaluated from the temperature dependence of resistivity above 100 K is enhanced from 30 to 40 meV with pressure from 0 to 1.8 GPa, as generally observed in conventional semiconductors. In the low-temperature range where a large Seebeck coefficient was observed, we evaluate the smaller energy gap from the magnetotransport tensor using a two-carrier model and find that the smaller gap exhibits a weak pressure dependence in contrast to that of the larger gap. To explain the pressure variations of the energy gaps, we propose a simple model that the smaller gap is a gap from the impurity level to the conduction band and the larger one is a gap between the valence and conduction bands, suggesting that the observed large Seebeck coefficient is not relevant to electron correlation effects.

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  • Received 7 May 2013

DOI:https://doi.org/10.1103/PhysRevB.88.165205

©2013 American Physical Society

Authors & Affiliations

H. Takahashi, R. Okazaki, and I. Terasaki

  • Department of Physics, Nagoya University, Nagoya 464-8602, Japan

Y. Yasui

  • Department of Physics, Meiji University, Kawasaki 214-8571, Japan

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Issue

Vol. 88, Iss. 16 — 15 October 2013

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