Thin Mn germanide films studied by XPS, STM, and XMCD

H. M. Zhang, J. Hirvonen Grytzelius, and L. S. O. Johansson
Phys. Rev. B 88, 045311 – Published 15 July 2013

Abstract

Thin Mn germanide films with nanoscale thicknesses on Ge(111) have been studied by low-energy electron diffraction (LEED), scanning tunneling microscopy (STM), core-level spectroscopy (CLS), and x-ray magnetic circular dichroism. The 260 C annealing of 16 monolayers of Mn deposited on Ge(111)c(2×8) resulted in a uniform film with intense threefold split 3×3 LEED spots and Moiré patterns in the STM images. This ultrathin film shows a clear ferromagnetism with a Curie temperature of 250 K. High-resolution Ge 3d CLS spectra were recorded with photon energies between 50 and 90 eV at normal and 60 emission angle. To achieve a consistent fit over the energy and angular range three components were used in the line-shape analysis. The low temperature (260 C) annealed film shows significant differences in terms of electronic structure and magnetism in contrast to the high temperature (330 C or above) annealed ones. Our results indicate that the annealing temperature and the Mn coverage play important roles in the formation of a thin magnetic Mn germanide film.

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  • Received 22 February 2013

DOI:https://doi.org/10.1103/PhysRevB.88.045311

©2013 American Physical Society

Authors & Affiliations

H. M. Zhang*, J. Hirvonen Grytzelius, and L. S. O. Johansson

  • Department of Engineering and Physics, Karlstad University, S-651 88 Karlstad, Sweden

  • *hanmin.zhang@kau.se

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Vol. 88, Iss. 4 — 15 July 2013

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