Abstract
First-principles calculations are used to explore the geometry, bonding, and electronic properties of MoS/TiC and MoS/TiC ( F and OH) semiconductor/metal contacts. The structure of the interfaces is determined. Strong chemical bonds formed at the MoS/TiC interface result in additional states next to the Fermi level, which extend over the three atomic layers of MoS and induce a metallic character. The interaction in MoS/TiC, on the other hand, is weak and not sensitive to the specific geometry, and the semiconducting nature thus is preserved. The energy level alignment implies weak and strong -type doping of MoS in MoS/TiCF and MoS/TiC(OH), respectively. The corresponding -type Schottky barrier heights are 0.85 and 0.26 eV. We show that the MoS/TiCF interface is close to the Schottky limit. At the MoS/TiC(OH) interface, we find that a strong dipole due to charge rearrangement induces the Schottky barrier. The present interfaces are well suited for application in all-two-dimensional devices.
- Received 17 February 2013
DOI:https://doi.org/10.1103/PhysRevB.87.245307
©2013 American Physical Society