Experimental visualization of scattering at defects in electronic transport through a single atomic junction

Yong-hui Zhang, Peter Wahl, and Klaus Kern
Phys. Rev. B 87, 205417 – Published 10 May 2013
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Abstract

For electronic transport at the nanoscale, coherent scattering at defects plays an important role. Therefore, the capability of visualizing the influence of defects on the conductivity of single atomic junctions may benefit the development of future nano-electronics. Here, we report imaging the coherent scattering from a defect with well-controlled geometry by quantum point contact microscopy recently developed by us. An ∼10% modulation in transport conductance of a single atomic junction is observed, with a phase shift of nearly π compared to the tunneling conductance. With the well-defined scattering geometry, we performed a theoretical calculation of the conductance and found the result consistent with the experiment.

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  • Received 14 June 2012

DOI:https://doi.org/10.1103/PhysRevB.87.205417

©2013 American Physical Society

Authors & Affiliations

Yong-hui Zhang1,2,*, Peter Wahl1,3, and Klaus Kern1,4

  • 1Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, 70569 Stuttgart, Germany
  • 2Department of Physics, Tsinghua University, Beijing 100084, China
  • 3SUPA, School of Physics and Astronomy, University of St. Andrews, North Haugh, St. Andrews, Fife KY16 9SS, UK
  • 4Institut de Physique de la Matière Condensée, Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland

  • *Correspondence should be addressed to: zhangyonghui02@tsinghua.org.cn

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Issue

Vol. 87, Iss. 20 — 15 May 2013

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