Linear systems approach to describing and classifying Fano resonances

I. Avrutsky, R. Gibson, J. Sears, G. Khitrova, H. M. Gibbs, and J. Hendrickson
Phys. Rev. B 87, 125118 – Published 13 March 2013

Abstract

We show that a generalized asymmetric resonant line shape derived elsewhere from rigorous electromagnetic calculations [Gallinet and Martin, Phys. Rev. B 83, 235427 (2011)] and from the two-oscillators model [Joe et al., Phys. Scr. 74, 259 (2006)] can also be obtained using a very general assumption that the spectral dependence of the scattering amplitudes is given by the transfer function of a linear system. We reformulate the line shape equation and show that in the case of a first-order transfer function all possible line shapes can be presented by a weighted sum of the original Fano and Lorentzian line shapes. We propose a new two-parameter classification scheme for asymmetric resonances with one parameter δ being the asymmetry factor of the Fano component and the other parameter η quantifying the relative weight of the Fano and Lorentzian components of the line shape. The proposed formula is used to fit experimental spectra of a silicon photonic crystal cavity nanobeam interrogated using a fiber taper probe.

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  • Received 24 July 2012

DOI:https://doi.org/10.1103/PhysRevB.87.125118

©2013 American Physical Society

Authors & Affiliations

I. Avrutsky1,2, R. Gibson1,3, J. Sears3, G. Khitrova3, H. M. Gibbs3, and J. Hendrickson1

  • 1Sensors Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433, USA
  • 2Department of Electrical and Computer Engineering, Wayne State University, 5050 Anthony Wayne Drive, Detroit, Michigan 48202, USA
  • 3College of Optical Sciences, University of Arizona, 1630 E University Blvd., Tucson, Arizona 85721, USA

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Vol. 87, Iss. 12 — 15 March 2013

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