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Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam

Yukio Takahashi, Akihiro Suzuki, Shin Furutaku, Kazuto Yamauchi, Yoshiki Kohmura, and Tetsuya Ishikawa
Phys. Rev. B 87, 121201(R) – Published 7 March 2013

Abstract

We experimentally demonstrate the visualization of nanoscale dislocation strain fields in a thick silicon single crystal by a coherent diffraction imaging technique called Bragg x-ray ptychography. We also propose that the x-ray microbeam carrying orbital angular momentum is selectively produced by coherent Bragg diffraction from dislocation singularities in crystals. This work not only provides us with a tool for characterizing dislocation strain fields buried within extended crystals but also opens up new scientific opportunities in femtosecond spectroscopy using x-ray free-electron lasers.

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  • Received 19 April 2012

DOI:https://doi.org/10.1103/PhysRevB.87.121201

©2013 American Physical Society

Authors & Affiliations

Yukio Takahashi1,*, Akihiro Suzuki1, Shin Furutaku1, Kazuto Yamauchi1, Yoshiki Kohmura2, and Tetsuya Ishikawa2

  • 1Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
  • 2RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo, Hyogo 679-5148, Japan

  • *Corresponding author: takahashi@prec.eng.osaka-u.ac.jp

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Issue

Vol. 87, Iss. 12 — 15 March 2013

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