Electronic, optical, and structural properties of (In,Ga)As/GaP quantum dots

C. Robert, C. Cornet, P. Turban, T. Nguyen Thanh, M. O. Nestoklon, J. Even, J. M. Jancu, M. Perrin, H. Folliot, T. Rohel, S. Tricot, A. Balocchi, D. Lagarde, X. Marie, N. Bertru, O. Durand, and A. Le Corre
Phys. Rev. B 86, 205316 – Published 19 November 2012

Abstract

We study in detail self-assembled (In,Ga)As quantum dots grown on GaP substrate from the structural, theoretical, and optical points of view. Single quantum dot morphology is first determined at the atomic level using plane-view scanning tunneling microscopy. Unusual C2 symmetry properties with high-index {136} facets are demonstrated for small quantum dots, whereas the apparent shape of the quantum dots approximately exhibits C2v symmetry, with the appearance of low-index {111} facets when the quantum dot ripens. This is interpreted as a consequence of the competition between strain and surface energy during quantum dot formation. Electronic properties are then simulated using both k·p and tight-binding models. The indium content and geometry of the quantum dots are found to have a strong influence on the transition type (direct-indirect). Finally, temperature-dependent optical properties of quantum dots are analyzed between 10 and 375 K. Photoluminescence and time-resolved photoluminescence studies show a clear proximity of two different types of optical transitions. Supported by the theoretical calculations, these transitions are interpreted as a competition between conduction band states in the X and Γ valleys.

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  • Received 23 April 2012

DOI:https://doi.org/10.1103/PhysRevB.86.205316

©2012 American Physical Society

Authors & Affiliations

C. Robert1,*, C. Cornet1, P. Turban2, T. Nguyen Thanh1, M. O. Nestoklon4, J. Even1, J. M. Jancu1, M. Perrin1, H. Folliot1, T. Rohel1, S. Tricot2, A. Balocchi3, D. Lagarde3, X. Marie3, N. Bertru1, O. Durand1, and A. Le Corre1

  • 1Université Européenne de Bretagne, INSA, FOTON, UMR 6082, F-35708 Rennes, France
  • 2Equipe de Physique des Surfaces et Interfaces, Institut de Physique de Rennes UMR UR1-CNRS 6251, Université de Rennes 1, F-35042 Rennes Cedex, France
  • 3Université de Toulouse, INSA-CNRS-UPS, LPCNO, 135 avenue de Rangueil, 31077 Toulouse, France
  • 4Ioffe Physico-Technical Institute, Russian Academy of Sciences, 194021 St. Petersburg, Russia

  • *Corresponding author: cedric.robert@insa-rennes.fr

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Issue

Vol. 86, Iss. 20 — 15 November 2012

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