Ab initio investigation of defect formation at ZrO2-CeO2 interfaces

Marco Fronzi, Silvia Cereda, Yoshitaka Tateyama, Alessandro De Vita, and Enrico Traversa
Phys. Rev. B 86, 085407 – Published 3 August 2012

Abstract

The structural and electronic properties of low index (100) and (111) ZrO2-CeO2 interfaces are analyzed on the basis of density functional theory calculations. The formation energy and relative stability of substitutional defects, oxygen vacancies, and vacancy-dopant complexes are investigated for the (100) orientation. By comparing these results with the ones obtained in bulk structures, we provide a possible explanation for the higher experimental ionic conductivity measured at the interface.

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  • Received 5 June 2012

DOI:https://doi.org/10.1103/PhysRevB.86.085407

©2012 American Physical Society

Authors & Affiliations

Marco Fronzi1,*, Silvia Cereda2, Yoshitaka Tateyama1, Alessandro De Vita2, and Enrico Traversa3,†

  • 1International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
  • 2Physics Department, King's College London, Strand, London, United Kingdom
  • 3International Research Center for Renewable Energy, State Key Laboratory of Multiphase Flow in Power Engineering, Xian Jiaotong University, Xian, Shaanxi, China

  • *Corresponding author: marco.fronzi@gmail.com
  • Corresponding author: traversa.enrico@gmail.com

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Issue

Vol. 86, Iss. 8 — 15 August 2012

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