Subwavelength imaging with quantum metamaterials

Ki Youl Yang, Vincenzo Giannini, Alexey O. Bak, Hemmel Amrania, Stefan A. Maier, and Chris C. Phillips
Phys. Rev. B 86, 075309 – Published 14 August 2012

Abstract

We study the potential of a novel “quantum metamaterial” for subwavelength imaging applications in the midinfrared. Because the layers that comprise the metamaterial have in-plane and out-of-plane dielectric responses that are determined by different physical mechanisms (Drude free electron response and quantized electronic transitions, respectively), their resonances are polarization sensitive and can be designed independently. The result is a negatively refracting anisotropic effective medium with losses, described by the figure of merit, FOM = Re(k)/Im(k) ∼ 200 (k is the wave vector), that are significantly lower than metamaterials based on classical layered systems. We find that, with sample design parameters that are realistically achievable with conventional epitaxy technologies, it is possible to obtain negative refraction for all incident angles, and finite element modeling studies indicate that these structures can function as so-called “hyperlenses,” offering low-loss ∼λ/13 spatial resolution at mid-IR wavelengths of λ ∼ 10 μm.

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  • Received 29 March 2012

DOI:https://doi.org/10.1103/PhysRevB.86.075309

©2012 American Physical Society

Authors & Affiliations

Ki Youl Yang*, Vincenzo Giannini, Alexey O. Bak, Hemmel Amrania, Stefan A. Maier, and Chris C. Phillips

  • Experimental Solid State Group, Department of Physics, Imperial College London, London SW7 2AZ, United Kingdom

  • *Present address: Thomas J. Watson Laboratory, California Institute of Technology, Pasadena, CA 91125.
  • Corresponding author: chris.phillips@imperial.ac.uk

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Issue

Vol. 86, Iss. 7 — 15 August 2012

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