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Distinguishing carbon nanotube defect chemistry using scanning gate spectroscopy

Steven R. Hunt, Elliot J. Fuller, Brad L. Corso, and Philip G. Collins
Phys. Rev. B 85, 235418 – Published 7 June 2012
Physics logo See Synopsis: Probing Defect Scattering

Abstract

Electronic scattering at individual defect sites is presumably sensitive to defect chemistry. Here, we combine advances in carbon nanotube device fabrication and scanning probe characterization to investigate this correspondence. Specifically, we apply scanning gate spectroscopy (SGS) to the study of defects introduced into single walled carbon nanotubes by point functionalization in water, sulfuric acid, or hydrochloric acid. SGS measures the energy-dependent transmission functions of defect sites, and by working in the dilute limit of individual, isolated defects we empirically distinguish the three chemical types. A preliminary analysis proposes a scattering model in order to motivate further theoretical investigations of this one-dimensional scattering system.

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  • Received 25 April 2012

DOI:https://doi.org/10.1103/PhysRevB.85.235418

©2012 American Physical Society

Synopsis

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Probing Defect Scattering

Published 7 June 2012

A scanning probe technique helps identify and characterize defects in a carbon nanotube.

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Authors & Affiliations

Steven R. Hunt, Elliot J. Fuller, Brad L. Corso, and Philip G. Collins*

  • Department of Physics and Astronomy, University of California, Irvine, Irvine, California 92697 USA

  • *Corresponding author: collinsp@uci.edu

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Issue

Vol. 85, Iss. 23 — 15 June 2012

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