Abstract
Electronic scattering at individual defect sites is presumably sensitive to defect chemistry. Here, we combine advances in carbon nanotube device fabrication and scanning probe characterization to investigate this correspondence. Specifically, we apply scanning gate spectroscopy (SGS) to the study of defects introduced into single walled carbon nanotubes by point functionalization in water, sulfuric acid, or hydrochloric acid. SGS measures the energy-dependent transmission functions of defect sites, and by working in the dilute limit of individual, isolated defects we empirically distinguish the three chemical types. A preliminary analysis proposes a scattering model in order to motivate further theoretical investigations of this one-dimensional scattering system.
- Received 25 April 2012
DOI:https://doi.org/10.1103/PhysRevB.85.235418
©2012 American Physical Society
Synopsis
Probing Defect Scattering
Published 7 June 2012
A scanning probe technique helps identify and characterize defects in a carbon nanotube.
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