Role of elastic bending stress on magnetism of a manganite thin film studied by polarized neutron reflectometry

Surendra Singh, M. R. Fitzsimmons, T. Lookman, H. Jeen, A. Biswas, M. A. Roldan, and M. Varela
Phys. Rev. B 85, 214440 – Published 29 June 2012
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Abstract

We measured the magnetization depth profile of a (La1xPrx)1yCayMnO3 (x = 0.60 ± 0.04, y = 0.20 ± 0.03) film using polarized neutron reflectometry as a function of applied elastic bending stress and temperature. We found unequivocal and until now elusive direct evidence that the exclusive application of compressive or tensile bending stress along the magnetic easy axis increases or decreases, respectively, the saturation magnetization of the film. Furthermore, we obtained a coupling coefficient relating strain to the depth-dependent saturation magnetization.

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  • Received 22 December 2011

DOI:https://doi.org/10.1103/PhysRevB.85.214440

©2012 American Physical Society

Authors & Affiliations

Surendra Singh1,2,*, M. R. Fitzsimmons1, T. Lookman1, H. Jeen3,†, A. Biswas3, M. A. Roldan4, and M. Varela5

  • 1Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
  • 2Solid State Physics Division, Bhabha Atomic Research Center, Mumbai 400085, India
  • 3Department of Physics, University of Florida, Gainesville, Florida 32611, USA
  • 4University Complutense, Madrid 28040, Spain
  • 5Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

  • *surendra@barc.gov.in
  • Present address: Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.

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Issue

Vol. 85, Iss. 21 — 1 June 2012

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