Reorientation transition of the magnetic proximity polarization in Fe/(Ga,Mn)As bilayers

M. Sperl, P. Torelli, F. Eigenmann, M. Soda, S. Polesya, M. Utz, D. Bougeard, H. Ebert, G. Panaccione, and C. H. Back
Phys. Rev. B 85, 184428 – Published 25 May 2012

Abstract

Recently, it has been observed that thin ferromagnetic Fe films deposited on top of (Ga,Mn)As layers induce a significant proximity polarization in the (Ga,Mn)As film even at room temperature. Furthermore, it was found that a thin interfacial region of the (Ga,Mn)As film is coupled antiferromagnetically to the Fe layer. Here we report a series of combined x-ray magnetic dichroism and superconducting quantum interference device magnetometer measurements for Fe/(Ga,Mn)As bilayers where the (Ga,Mn)As layer thickness is varied between 5 and 50 nm. We find a reorientation transition of the magnetic proximity polarization as a function of the (Ga,Mn)As thickness. The data are compared to results obtained performing ab initio calculations. A varying concentration of Mn interstitials as a function of (Ga,Mn)As layer thickness is responsible for this reorientation. Furthermore, exchange bias is studied in the fully epitaxial bilayer system. We find a rather strong ferromagnetic exchange bias. The strength of the exchange bias can be estimated by using a simple partial domain wall model.

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  • Received 29 August 2011

DOI:https://doi.org/10.1103/PhysRevB.85.184428

©2012 American Physical Society

Authors & Affiliations

M. Sperl1, P. Torelli2, F. Eigenmann1, M. Soda1, S. Polesya3, M. Utz1, D. Bougeard1, H. Ebert3, G. Panaccione2, and C. H. Back1

  • 1Institut für Experimentelle und Angewandte Physik, University of Regensburg, 93040 Regensburg, Germany
  • 2Consiglio Nazionale delle Ricerche-Istituto Officina dei Materiali (CNR-IOM), Laboratorio TASC, in Area Science Park, I-34149 Trieste, Italy
  • 3Department of Chemistry, Ludwig-Maximilians University Munich, 81377 München, Germany

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Issue

Vol. 85, Iss. 18 — 1 May 2012

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