Evidence for interlayer electronic coupling in multilayer epitaxial graphene from polarization-dependent coherently controlled photocurrent generation

Dong Sun, Julien Rioux, J. E. Sipe, Yang Zou, Momchil T. Mihnev, Claire Berger, Walt A. de Heer, Phillip N. First, and Theodore B. Norris
Phys. Rev. B 85, 165427 – Published 13 April 2012

Abstract

Most experimental studies to date of multilayer epitaxial graphene on C-face SiC have indicated that the electronic states of different layers are decoupled as a consequence of rotational stacking. We have measured the third-order nonlinear tensor in epitaxial graphene as a novel approach to probe interlayer electronic coupling, by studying THz emission from coherently controlled photocurrents as a function of the optical pump and THz beam polarizations. We find that the polarization dependence of the coherently controlled THz emission expected from perfectly uncoupled layers, i.e. a single graphene sheet, is not observed. We hypothesize that the observed angular dependence arises from weak coupling between the layers; a model calculation, treating the interlayer coupling as bilayer coupling with variable strength, qualitatively reproduces the polarization angular dependence, providing evidence for coupling.

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  • Received 9 February 2012

DOI:https://doi.org/10.1103/PhysRevB.85.165427

©2012 American Physical Society

Authors & Affiliations

Dong Sun1, Julien Rioux2,*, J. E. Sipe2, Yang Zou1,4, Momchil T. Mihnev1, Claire Berger3, Walt A. de Heer3, Phillip N. First3, and Theodore B. Norris1,†

  • 1Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, Michigan 48109-2099, USA
  • 2Department of Physics, University of Toronto, Ontario, Canada M5S 1A7
  • 3School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA
  • 4Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei, China 230026

  • *Present address: Department of Physics, University of Konstanz, D-78457 Konstanz, Germany.
  • Corresponding author: tnorris@eecs.umich.edu

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Issue

Vol. 85, Iss. 16 — 15 April 2012

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