Magnetic properties of Cu-doped GaN grown by molecular beam epitaxy

Philipp R. Ganz, Gerda Fischer, Christoph Sürgers, and Daniel M. Schaadt
Phys. Rev. B 85, 165204 – Published 5 April 2012

Abstract

Cu-doped GaN films were epitaxially grown by molecular beam epitaxy on C-plane sapphire substrates with an AlN buffer layer. Growth under metal-rich and nitrogen-rich conditions was investigated for different Cu-to-Ga beam-equivalent-pressure ratios xBEP. The samples were characterized by scanning electron microscopy, energy dispersive x-ray spectroscopy, and x-ray diffraction. Films within a narrow range of xBEP around 1% exhibit ferromagnetic behavior with a Curie temperature higher than 400 K. For higher xBEP>1%, islands of a Cu-Ga compound are predominantly formed at the surface as nonferromagnetic precipitates. Our detailed study shows that the saturation magnetization of ferromagnetic films with xBEP1% decreases with increasing film thickness. This suggests that the ferromagnetism arises from defects, such as threading dislocations, created by the incorporation of Cu into the GaN.

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  • Received 6 June 2011

DOI:https://doi.org/10.1103/PhysRevB.85.165204

©2012 American Physical Society

Authors & Affiliations

Philipp R. Ganz1,2, Gerda Fischer3, Christoph Sürgers1,3,*, and Daniel M. Schaadt1,2,4

  • 1Karlsruhe Institute of Technology, DFG-Center for Functional Nanostructures, P.O. Box 6980, 76049 Karlsruhe, Germany
  • 2Karlsruhe Institute of Technology, Institut für Angewandte Physik, P.O. Box 6980, 76049 Karlsruhe, Germany
  • 3Karlsruhe Institute of Technology, Physikalisches Institut, P.O. Box 6980, 76049 Karlsruhe, Germany
  • 4Clausthal University of Technology, Institute for Energy Research and Physical Technologies, Am Stollen 19B, 38640 Goslar, Germany

  • *christoph.suergers@kit.edu

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Issue

Vol. 85, Iss. 16 — 15 April 2012

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