Longitudinal and transverse exciton-spin relaxation in a single InAsP quantum dot embedded inside a standing InP nanowire using photoluminescence spectroscopy

H. Sasakura, C. Hermannstädter, S. N. Dorenbos, N. Akopian, M. P. van Kouwen, J. Motohisa, Y. Kobayashi, H. Kumano, K. Kondo, K. Tomioka, T. Fukui, I. Suemune, and V. Zwiller
Phys. Rev. B 85, 075324 – Published 29 February 2012

Abstract

We have investigated the optical properties of a single InAsP quantum dot embedded in a standing InP nanowire. Elongation of the transverse exciton-spin relaxation time of the exciton state with decreasing excitation power was observed by first-order photon correlation measurements. This behavior is well explained by the motional narrowing mechanism induced by Gaussian fluctuations of environmental charges in the nanowire. The longitudinal exciton-spin relaxation time is evaluated by the degree of the random polarization of emission originating from exciton states confined in a single-nanowire quantum dot by using Mueller calculus based on Stokes parameters representation. The reduction in the random polarization component with decreasing excitation power is caused by suppression of the exchange interaction of electron and hole due to an optically induced internal electric field by the dipoles at the wurtzite and zinc-blende heterointerfaces in the InP nanowire.

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  • Received 15 February 2012

DOI:https://doi.org/10.1103/PhysRevB.85.075324

©2012 American Physical Society

Authors & Affiliations

H. Sasakura1,*, C. Hermannstädter1, S. N. Dorenbos2, N. Akopian2, M. P. van Kouwen2, J. Motohisa3, Y. Kobayashi3, H. Kumano1, K. Kondo1, K. Tomioka3,4, T. Fukui3,4, I. Suemune1, and V. Zwiller2

  • 1Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0021, Japan
  • 2Kavli Institute of Nanoscience, Delft University of Technology, NL-2628 CJ Delft, The Netherlands
  • 3Graduate School of Information Science Technology, Hokkaido University, Sapporo 060-0814, Japan
  • 4Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Sapporo 060-8628, Japan

  • *hirotaka@eng.hokudai.ac.jp

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Vol. 85, Iss. 7 — 15 February 2012

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