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Efficiency of quasiparticle evacuation in superconducting devices

Sukumar Rajauria, L. M. A. Pascal, Ph. Gandit, F. W. J. Hekking, B. Pannetier, and H. Courtois
Phys. Rev. B 85, 020505(R) – Published 23 January 2012

Abstract

The diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction is studied. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.

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  • Received 18 December 2011

DOI:https://doi.org/10.1103/PhysRevB.85.020505

©2012 American Physical Society

Authors & Affiliations

Sukumar Rajauria1, L. M. A. Pascal1, Ph. Gandit1, F. W. J. Hekking2, B. Pannetier1, and H. Courtois1

  • 1Institut Néel, CNRS and Université Joseph Fourier, 25 Avenue des Martyrs, F-38042 Grenoble, France
  • 2Laboratoire de Physique et Modélisation des Milieux Condensés (LPMMC), Université Joseph Fourier and CNRS, 25 Avenue des Martyrs, F-38042 Grenoble, France

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Vol. 85, Iss. 2 — 1 January 2012

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