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Quantitative x-ray phase nanotomography

Ana Diaz, Pavel Trtik, Manuel Guizar-Sicairos, Andreas Menzel, Pierre Thibault, and Oliver Bunk
Phys. Rev. B 85, 020104(R) – Published 31 January 2012

Abstract

X-ray ptychographic computed tomography has recently emerged as a nondestructive characterization tool for samples with representative sizes of several tens of micrometers, yet offering a resolution currently lying in but not limited to the 100-nm range. Here we evaluate the quantitativeness of this technique using a model sample with a known structure and density, and we discuss its sensitivity as a function of resolution. Additionally, we show an example application for the determination of the mass density of individual 2μm-sized SiO2 microspheres with a relative error of 2%. The accuracy and sensitivity demonstrated in this paper will enable quantitative imaging, segmentation, and identification of different phases in complex materials at the nanoscale.

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  • Received 2 November 2011

DOI:https://doi.org/10.1103/PhysRevB.85.020104

©2012 American Physical Society

Authors & Affiliations

Ana Diaz1,*, Pavel Trtik2, Manuel Guizar-Sicairos1, Andreas Menzel1, Pierre Thibault3, and Oliver Bunk1

  • 1Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland
  • 2Empa, Swiss Federal Laboratories for Materials Science and Technology, CH-8600 Dübendorf, Switzerland
  • 3Department of Physics, Technische Universität München, D-85748 Garching, Germany

  • *ana.diaz@psi.ch

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Vol. 85, Iss. 2 — 1 January 2012

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