Intermediate valence in Yb compounds probed by 4f photoemission and resonant inelastic x-ray scattering

K. Kummer, Yu. Kucherenko, S. Danzenbächer, C. Krellner, C. Geibel, M. G. Holder, L. V. Bekenov, T. Muro, Y. Kato, T. Kinoshita, S. Huotari, L. Simonelli, S. L. Molodtsov, C. Laubschat, and D. V. Vyalikh
Phys. Rev. B 84, 245114 – Published 13 December 2011

Abstract

Experimental data from 4f photoemission and resonant inelastic x-ray scattering experiments on the intermediate valent compound YbRh2Si2 have been compared with results of theoretical simulations. It was found that the high-energy excitations inherent to these techniques affect the spectral intensities related to different 4f configurations differently. Although the final states in 4f photoemission and x-ray absorption or resonant inelastic x-ray scattering are rather unalike, a comparable influence was found for both cases. Higher occupied 4f shells seem to be energetically favored in the excited states and appear overemphasized in the spectrum as compared to the ground state. For a quantitative Yb valence determination from x-ray spectroscopies, diagrams are suggested that seem to be applicable also for other intermediate valent Yb compounds.

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  • Received 18 July 2011

DOI:https://doi.org/10.1103/PhysRevB.84.245114

©2011 American Physical Society

Authors & Affiliations

K. Kummer1,2, Yu. Kucherenko2,3, S. Danzenbächer2, C. Krellner4, C. Geibel4, M. G. Holder2, L. V. Bekenov3, T. Muro5, Y. Kato5, T. Kinoshita5, S. Huotari1, L. Simonelli1, S. L. Molodtsov6, C. Laubschat2, and D. V. Vyalikh2

  • 1European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, B.P. 220, FR-38043 Grenoble Cedex, France
  • 2Institut für Festkörperphysik, Technische Universität Dresden, DE-01062 Dresden, Germany
  • 3Institute for Metal Physics, National Academy of Science of Ukraine, UA-03142 Kiev, Ukraine
  • 4Max-Planck-Institut für Chemische Physik fester Stoffe, DE-01187 Dresden, Germany
  • 5SPring-8, Japan Synchrotron Radiation Research Institute, Hyogo 679-5198, Japan
  • 6European XFEL GmbH, Albert-Einstein-Ring 19, DE-22761 Hamburg, Germany

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Vol. 84, Iss. 24 — 15 December 2011

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