Geometry-dependent critical currents in superconducting nanocircuits

John R. Clem and Karl K. Berggren
Phys. Rev. B 84, 174510 – Published 18 November 2011

Abstract

In this paper, we calculate the critical currents in thin superconducting strips with sharp right-angle turns, 180 turnarounds, and more complicated geometries, where all the line widths are much smaller than the Pearl length Λ=2λ2/d. We define the critical current as the current that reduces the Gibbs-free-energy barrier to zero. We show that current crowding, which occurs whenever the current rounds a sharp turn, tends to reduce the critical current, but we also show that when the radius of curvature is less than the coherence length, this effect is partially compensated by a radius-of-curvature effect. We propose several patterns with rounded corners to avoid critical-current reduction due to current crowding. These results are relevant to superconducting nanowire single-photon detectors, where they suggest a means of improving the bias conditions and reducing dark counts. These results also have relevance to normal-metal nanocircuits, as these patterns can reduce the electrical resistance, electromigration, and hot spots caused by nonuniform heating.

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  • Received 22 September 2011

DOI:https://doi.org/10.1103/PhysRevB.84.174510

©2011 American Physical Society

Authors & Affiliations

John R. Clem

  • Ames Laboratory and Department of Physics and Astronomy, Iowa State University, Ames, Iowa 50011-3160, USA

Karl K. Berggren

  • Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA and Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, NL-2628CJ Delft, The Netherlands

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Vol. 84, Iss. 17 — 1 November 2011

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