Interfacial electronic and magnetic properties of a Y0.6Pr0.4Ba2Cu3O7/La2/3Ca1/3MnO3 superlattice

Jian Liu, B. J. Kirby, B. Gray, M. Kareev, H.-U. Habermeier, G. Cristiani, J. W. Freeland, and J. Chakhalian
Phys. Rev. B 84, 092506 – Published 28 September 2011

Abstract

Resonant soft x-ray absorption spectroscopy and diffuse neutron scattering were used to study the interfacial properties of Y0.6Pr0.4Ba2Cu3O7/La2/3Ca1/2MnO3 superlattices. Dramatic changes from the bulk in the spectral line shape, energy position, and linear-polarization dependence of the Cu L3-edge reveal a striking interfacial modification. The similarities to the case without Pr substitution confirm the strongly hybridized covalent Cu-O-Mn bond as the underlying driving mechanism. On the other hand, relative differences, including reduced charge transfer and interfacial orbital reconstruction, are observed and attributed to raising of the Fermi level of the cuprate layer with Pr substitution. Neutron reflectometry reveals an oscillatory behavior in the rapidly increasing diffuse scattering with decreasing temperature. Temperature- and field-dependent measurements indicate that the origin is associated with the buckling caused by the structural phase transition of the SrTiO3 substrate rather than the superconducting or magnetic transition.

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  • Received 15 June 2011

DOI:https://doi.org/10.1103/PhysRevB.84.092506

©2011 American Physical Society

Authors & Affiliations

Jian Liu1,2,*, B. J. Kirby3, B. Gray1, M. Kareev1, H.-U. Habermeier4, G. Cristiani4, J. W. Freeland5, and J. Chakhalian1,†

  • 1Department of Physics, University of Arkansas, Fayetteville, Arkansas 72701, USA
  • 2Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  • 3Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
  • 4Max Plank Institute for Solid State Research, D-70569 Stuttgart, Germany
  • 5Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

  • *jxl026@uark.edu
  • jchakhal@uark.edu

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Vol. 84, Iss. 9 — 1 September 2011

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