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Helical magnetic order in MnSi thin films

E. A. Karhu, S. Kahwaji, M. D. Robertson, H. Fritzsche, B. J. Kirby, C. F. Majkrzak, and T. L. Monchesky
Phys. Rev. B 84, 060404(R) – Published 22 August 2011

Abstract

We present a study of the magnetic structure of crystalline MnSi(111) thin films grown by molecular beam epitaxy. A combination of polarized neutron reflectometry (PNR) and superconducting quantum interference device magnetometry show that the films have helical magnetic order with a pitch vector Q along the film normal. The helix wavelength of 2π/Q=13.9±0.1 nm is found to be independent of thickness below 40 nm. PNR shows that the magnetic structure has both left-handed and right-handed chiralities due to the presence of inversion domains observed by transmission electron microscopy.

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  • Received 2 June 2011

DOI:https://doi.org/10.1103/PhysRevB.84.060404

©2011 American Physical Society

Authors & Affiliations

E. A. Karhu1, S. Kahwaji1, M. D. Robertson2, H. Fritzsche3, B. J. Kirby4, C. F. Majkrzak4, and T. L. Monchesky1,*

  • 1Department of Physics and Atmospheric Science, Dalhousie University, Halifax, Nova Scotia, Canada B3H 3J5
  • 2Department of Physics, Acadia University, Wolfville, Nova Scotia, Canada B4P 2R6
  • 3National Research Council Canada, Canadian Neutron Beam Centre, Chalk River, Ontario, Canada K0J 1J0
  • 4Center for Neutron Research, NIST, Gaithersburg, Maryland 20899, USA

  • *theodore.monchesky@dal.ca

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Issue

Vol. 84, Iss. 6 — 1 August 2011

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