Charge separation and temperature-induced carrier migration in Ga1xInxNyAs1y multiple quantum wells

T. Nuytten, M. Hayne, Bhavtosh Bansal, H. Y. Liu, M. Hopkinson, and V. V. Moshchalkov
Phys. Rev. B 84, 045302 – Published 5 July 2011

Abstract

We have investigated the photoluminescence (PL) of two carefully selected dilute nitride Ga1xInxNyAs1y multiple quantum well structures in magnetic fields up to 50 T as a function of temperature and excitation power. The observation of a nonmonotonic dependence of the PL energy on temperature indicates that localized states dominate the luminescence at low temperature, while magneto-PL experiments give new insights into the nature of the localization. We find that the low-temperature spatial distribution of carriers in the quantum well is different for electrons and holes because they are captured by different disorder-induced complexes that are spatially separated. A study of the thermalization of the carriers toward free states leads to the determination of the free-exciton wave-function extent in these systems and enables an assessment of the localization potentials induced by inhomogeneity in the quantum well.

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  • Received 16 December 2009

DOI:https://doi.org/10.1103/PhysRevB.84.045302

©2011 American Physical Society

Authors & Affiliations

T. Nuytten*

  • Institute for Nanoscale Physics and Chemistry (INPAC), K.U. Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium

M. Hayne

  • Department of Physics, Lancaster University, Lancaster LA1 4YB, United Kingdom

Bhavtosh Bansal

  • Department of Physical Sciences, Indian Institute of Science Education and Research (IISER) Kolkata, Mohanpur, Nadia 741252, India

H. Y. Liu and M. Hopkinson

  • Department of Electronic and Electrical Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, United Kingdom

V. V. Moshchalkov

  • Institute for Nanoscale Physics and Chemistry (INPAC), K.U. Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium

  • *thomas.nuytten@fys.kuleuven.be
  • Present address: Department of Electronic and Electrical Engineering, University College London, Torrington Place, London WC1E 7JE, United Kingdom.

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Issue

Vol. 84, Iss. 4 — 15 July 2011

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