System-size convergence of point defect properties: The case of the silicon vacancy

Fabiano Corsetti and Arash A. Mostofi
Phys. Rev. B 84, 035209 – Published 29 July 2011

Abstract

We present a comprehensive study of the vacancy in bulk silicon in all its charge states from 2+ to 2, using a supercell approach within plane-wave density-functional theory, and systematically quantify the various contributions to the well-known finite size errors associated with calculating formation energies and stable charge state transition levels of isolated defects with periodic boundary conditions. Furthermore, we find that transition levels converge faster with respect to supercell size when only the Γ-point is sampled in the Brillouin zone, as opposed to a dense k-point sampling. This arises from the fact that defect level at the Γ-point quickly converges to a fixed value which correctly describes the bonding at the defect center. Our calculated transition levels with 1000-atom supercells and Γ-point only sampling are in good agreement with available experimental results. We also demonstrate two simple and accurate approaches for calculating the valence band offsets that are required for computing formation energies of charged defects, one based on a potential averaging scheme and the other using maximally-localized Wannier functions (MLWFs). Finally, we show that MLWFs provide a clear description of the nature of the electronic bonding at the defect center that verifies the canonical Watkins model.

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  • Received 19 October 2010

DOI:https://doi.org/10.1103/PhysRevB.84.035209

©2011 American Physical Society

Authors & Affiliations

Fabiano Corsetti* and Arash A. Mostofi

  • Thomas Young Centre, Imperial College London, London SW7 2AZ, United Kingdom

  • *fabiano.corsetti08@imperial.ac.uk

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Issue

Vol. 84, Iss. 3 — 15 July 2011

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