Abstract
The ground state electronic structure of thallic oxide has been a source of controversy in the literature, with TlO reported to be either a degenerate -type semiconductor or an intrinsic semimetal with no band gap. Using a screened hybrid density functional theory (DFT) approach, we show that TlO is a semiconductor with a predicted band gap of 0.33 . We rationalize the large optical band gaps reported in experimental studies and demonstrate that previous “standard” DFT approaches wrongly predict TlO to be a semimetal. Doubly ionized oxygen vacancies are shown to be the origin of the high carrier concentrations seen experimentally.
- Received 11 February 2011
DOI:https://doi.org/10.1103/PhysRevB.83.233202
©2011 American Physical Society