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Polarization-resolved fine-structure splitting of zero-dimensional InxGa1xN excitons

S. Amloy, Y. T. Chen, K. F. Karlsson, K. H. Chen, H. C. Hsu, C. L. Hsiao, L. C. Chen, and P. O. Holtz
Phys. Rev. B 83, 201307(R) – Published 18 May 2011

Abstract

The fine-structure splitting of quantum confined InxGa1xN excitons is investigated using polarization-sensitive photoluminescence spectroscopy. The majority of the studied emission lines exhibits mutually orthogonal fine-structure components split by 100–340 μeV, as measured from the cleaved edge of the sample. The exciton and the biexciton reveal identical magnitudes but reversed sign of the energy splitting.

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  • Received 29 January 2011

DOI:https://doi.org/10.1103/PhysRevB.83.201307

©2011 American Physical Society

Authors & Affiliations

S. Amloy1,2, Y. T. Chen3, K. F. Karlsson1, K. H. Chen3,4, H. C. Hsu4, C. L. Hsiao4, L. C. Chen4, and P. O. Holtz1

  • 1Department of Physics, Chemistry, and Biology, Linköping University, S-58183 Linköping, Sweden
  • 2Department of Physics, Faculty of Science, Thaksin University, Phattalung 93110, Thailand
  • 3Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan
  • 4Center for Condensed Matter Sciences, National Taiwan University, Taipei 106, Taiwan

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Issue

Vol. 83, Iss. 20 — 15 May 2011

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