Abstract
The fine-structure splitting of quantum confined InGaN excitons is investigated using polarization-sensitive photoluminescence spectroscopy. The majority of the studied emission lines exhibits mutually orthogonal fine-structure components split by 100–340 μeV, as measured from the cleaved edge of the sample. The exciton and the biexciton reveal identical magnitudes but reversed sign of the energy splitting.
- Received 29 January 2011
DOI:https://doi.org/10.1103/PhysRevB.83.201307
©2011 American Physical Society