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Chemical control of the charge state of nitrogen-vacancy centers in diamond

M. V. Hauf, B. Grotz, B. Naydenov, M. Dankerl, S. Pezzagna, J. Meijer, F. Jelezko, J. Wrachtrup, M. Stutzmann, F. Reinhard, and J. A. Garrido
Phys. Rev. B 83, 081304(R) – Published 14 February 2011
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Abstract

We investigate the effect of surface termination on the charge state of nitrogen-vacancy (NV) centers, which have been ion-implanted a few nanometers below the surface of diamond. We find that, when changing the surface termination from oxygen to hydrogen, previously stable NV centers convert into NV0 and, subsequently, into an unknown nonfluorescent state. This effect is found to depend strongly on the implantation dose. Simulations of the electronic band structure confirm the disappearance of NV in the vicinity of the hydrogen-terminated surface. The band bending, which induces a p-type surface conductive layer, leads to a depletion of electrons in the nitrogen-vacancies close to the surface. Therefore, hydrogen surface termination provides a chemical way to control the charge state of nitrogen-vacancy centers in diamond. Furthermore, it opens the way to electrostatic control of the charge state with the use of an external gate electrode.

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  • Received 3 December 2010

DOI:https://doi.org/10.1103/PhysRevB.83.081304

©2011 American Physical Society

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Chemical manipulation of nitrogen-vacancy centers in diamond

Published 15 February 2011

Surface termination is used to chemically control the state of nitrogen-vacancy centers in diamond.

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Authors & Affiliations

M. V. Hauf1, B. Grotz2, B. Naydenov2, M. Dankerl1, S. Pezzagna3, J. Meijer3, F. Jelezko2, J. Wrachtrup2, M. Stutzmann1, F. Reinhard2,*, and J. A. Garrido1,†

  • 1Walter Schottky Institut, Technische Universität München, D-85748 Garching, Germany
  • 23rd Physics Institute and Research Center SCoPE, University of Stuttgart, D-70550 Stuttgart, Germany
  • 3RUBION, Ruhr-Universität Bochum, D-44780 Bochum, Germany

  • *f.reinhard@physik.uni-stuttgart.de
  • JoseAntonio.Garrido@wsi.tum.de

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Issue

Vol. 83, Iss. 8 — 15 February 2011

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