Effect of pressure on the magnetic, transport, and thermal-transport properties of the electron-doped manganite CaMn1xSbxO3

Yuh Murano, Michiaki Matsukawa, Syuya Ohuchi, Satoru Kobayashi, Shigeki Nimori, Ramanathan Suryanarayanan, Keiichi Koyama, and Norio Kobayashi
Phys. Rev. B 83, 054437 – Published 28 February 2011

Abstract

We have demonstrated the effect of hydrostatic pressure on magnetic and transport properties, and thermal-transport properties in the electron-doped manganite CaMn1xSbxO3. The substitution of Sb5+ ion for Mn 4+ site of the parent matrix causes one-electron doping with the chemical formula CaMn12x4+Mnx3+Sbx5+O3 accompanied by a monotonous increase in unit-cell volume as a function of x. Upon increasing the doping level of Sb, the magnitudes of both electrical resistivity and negative Seebeck coefficient are suppressed at high temperatures, indicating the electron doping. Anomalous diamagnetic behaviors at x=0.05 and 0.08 are clearly observed in the field cooled dc magnetization. The effect of hydrostatic pressure on dc magnetization is in contrast to the chemical pressure effect due to Sb doping. The dynamical effect of ac magnetic susceptibility measurement points to the formation of the magnetically frustrated clusters such as FM clusters embedded in canted AFM matrix.

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  • Received 21 April 2010

DOI:https://doi.org/10.1103/PhysRevB.83.054437

©2011 American Physical Society

Authors & Affiliations

Yuh Murano1,†, Michiaki Matsukawa1,*, Syuya Ohuchi1, Satoru Kobayashi1, Shigeki Nimori2, Ramanathan Suryanarayanan3, Keiichi Koyama4, and Norio Kobayashi5

  • 1Department of Materials Science and Engineering, Iwate University, Morioka 020-8551, Japan
  • 2National Institute for Materials Science, Tsukuba 305-0047, Japan
  • 3Laboratoire de Physico-Chimie de L’Etat Solide, CNRS,UMR8182 Universite Paris-Sud, F-91405 Orsay, France
  • 4Graduate School of Science and Engineering, Kagoshima University, Kagoshima 890-0065, Japan
  • 5Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan

  • *matsukawa@iwate-u.ac.jp
  • Present address: DOWA Electronics Materials Co., Ltd., Okayama 702-8045, Japan

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Issue

Vol. 83, Iss. 5 — 1 February 2011

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