Observation of dd excitations in NiO and NiCl2 using K-edge resonant inelastic x-ray scattering

Michel van Veenendaal, Xiaosong Liu, Matthew H. Carpenter, and Stephen P. Cramer
Phys. Rev. B 83, 045101 – Published 10 January 2011

Abstract

The presence of dd excitations in K-edge resonant inelastic x-ray scattering in the 1s4p region of transition-metal compounds and their excitation mechanism is established through measurements of NiO and NiCl2. It is demonstrated that the valence excitations are due to the interaction between the excited 4p electron and the 3d valence electrons. A detailed analytical framework for interpreting these excitations in transition-metal compounds is presented, demonstrating a strong angular dependence for different dd excitations.

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  • Received 2 December 2010

DOI:https://doi.org/10.1103/PhysRevB.83.045101

© 2011 American Physical Society

Authors & Affiliations

Michel van Veenendaal1,2, Xiaosong Liu3, Matthew H. Carpenter4, and Stephen P. Cramer3,4

  • 1Department of Physics, Northern Illinois University, De Kalb, Illinois 60115, USA
  • 2Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA
  • 3Physical Biosciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, USA
  • 4Department of Applied Science, University of California, Davis, California 95616, USA

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Issue

Vol. 83, Iss. 4 — 1 January 2011

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