Figure 1
(Color online) (a) Emission intensities from nanowires on layered substrates as a function of nanowire length
. The diameters of all nanowires were selected to be in the range
. Inset: a schematic of the experimental measurement. Incident light of wavelength 633 nm, polarized parallel to the nanowire, is directed onto one end of the nanowire. Light emitted from the other end is measured for various nanowire lengths
and silica layer thicknesses
, 67, and 110 nm. When there is no observable light emission, the scattered light at the end of the nanowire is recorded and represented by hollow dots. (b) Average emission intensity for nanowires (black squares) of length
and diameter
as a function of the silica layer thickness
. The curve is the theoretical simulation (FDTD) of this geometry. (c) In-coupling coefficient
as a function of silica thickness
. The unit for
and
in (b) and (c) is arbitrary. (d)
damping length of SPPs as a function of
. The curve is the calculated
divided by 1.4, discussed in the text. The refractive index of silicon is 3.882. The refractive of the oil is index matched to silica
.
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