Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam

Georgios Ctistis, Alex Hartsuiker, Edwin van der Pol, Julien Claudon, Willem L. Vos, and Jean-Michel Gérard
Phys. Rev. B 82, 195330 – Published 29 November 2010

Abstract

We have performed white light reflectivity measurements on GaAs/AlAs micropillar cavities with diameters ranging from 1μm up to 20μm. We are able to resolve the spatial field distribution of each cavity mode in real space by scanning a small-sized beam across the top facet of each micropillar. We spectrally resolve distinct transverse-optical cavity modes in reflectivity. Using this procedure we can selectively address a single mode in the multimode micropillar cavity. Calculations for the coupling efficiency of a small-diameter beam to each mode are in very good agreement with our reflectivity measurements.

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  • Received 2 July 2010

DOI:https://doi.org/10.1103/PhysRevB.82.195330

©2010 American Physical Society

Authors & Affiliations

Georgios Ctistis1,2,*, Alex Hartsuiker1,2, Edwin van der Pol1,2, Julien Claudon3, Willem L. Vos1, and Jean-Michel Gérard3

  • 1Complex Photonic Systems (COPS), MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands
  • 2Center for Nanophotonics, FOM Institute for Atomic and Molecular Physics (AMOLF), Science Park 113, 1098 XG Amsterdam, The Netherlands
  • 3Nanophysics and Semiconductor Laboratory, CEA/INAC/SP2M, 17 rue des Martyrs, 38054 Grenoble Cedex, France

  • *g.ctistis@utwente.nl

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Issue

Vol. 82, Iss. 19 — 15 November 2010

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