Molecular self-organization: Predicting the pattern diversity and lowest energy state of competing ordering motifs

B. A. Hermann, C. Rohr, M. Balbás Gambra, A. Malecki, M. S. Malarek, E. Frey, and T. Franosch
Phys. Rev. B 82, 165451 – Published 29 October 2010

Abstract

Self-organized monolayers of highly flexible Fréchet dendrons were deposited on graphite surfaces by solution casting. Scanning tunneling microscopy (STM) reveals an unprecedented variety of patterns with up to seven stable hierarchical ordering motifs allowing us to use these molecules as a versatile model system. The essential molecular properties determined by molecular mechanics simulations are condensed to a coarse grained interaction-site model of various chain configurations. In a Monte Carlo approach with random starting configurations, the experimental pattern diversity can be reproduced in all facets of the local and global ordering. Based on an energy analysis of the Monte Carlo and molecular mechanics modeling, the thermodynamically most stable pattern is predicted and shown to coincide with the pattern which dominates the STM images after several hours or upon moderate heating.

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  • Received 22 March 2010

DOI:https://doi.org/10.1103/PhysRevB.82.165451

©2010 American Physical Society

Authors & Affiliations

B. A. Hermann1,*, C. Rohr1, M. Balbás Gambra2, A. Malecki1, M. S. Malarek3, E. Frey2, and T. Franosch4,2

  • 1Center for Nano Science (CeNS) and Walther-Meissner-Institute of Low Temperature Research of the Bavarian Academy of Sciences, Walther-Meissner-Str. 8, 85748 Garching, Germany
  • 2Arnold Sommerfeld Center for Theoretical Physics (ASC) and Center for Nano Science (CeNS), Department of Physics, LMU München, Theresienstraße 37, 80333 München, Germany
  • 3Department of Chemistry, University of Basel, Spitalstrasse 51, 4056 Basel, Switzerland
  • 4Institut für Theoretische Physik, Universität Erlangen–Nürnberg, Staudtstraße 7, 91058 Erlangen, Germany

  • *Author to whom correspondence should be addressed; b.hermann@cens.de

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Vol. 82, Iss. 16 — 15 October 2010

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