• Rapid Communication

Shot noise suppression and hopping conduction in graphene nanoribbons

R. Danneau, F. Wu, M. Y. Tomi, J. B. Oostinga, A. F. Morpurgo, and P. J. Hakonen
Phys. Rev. B 82, 161405(R) – Published 7 October 2010

Abstract

We have investigated shot noise and conduction of graphene field-effect nanoribbon devices at low temperature. By analyzing the exponential IV characteristics of our devices in the transport gap region, we found out that transport follows variable range hopping laws at intermediate bias voltages 1<Vbias<12mV. In parallel, we observe a strong shot noise suppression leading to very low Fano factors. The strong suppression of shot noise is consistent with inelastic hopping, in crossover from one- to two-dimensional regime, indicating that the localization length lloc<W in our nanoribbons.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 22 May 2010

DOI:https://doi.org/10.1103/PhysRevB.82.161405

©2010 American Physical Society

Authors & Affiliations

R. Danneau1,2,*, F. Wu1,†, M. Y. Tomi1, J. B. Oostinga3, A. F. Morpurgo3, and P. J. Hakonen1

  • 1Low Temperature Laboratory, Aalto University, P.O. Box 13500, FI-00076 AALTO, Finland
  • 2Institute of Nanotechnology, Karlsruhe Institute of Technology, D-76021 Karlsruhe, Germany and Institute of Physics, Karlsruhe Institute of Technology, D-76128 Karlsruhe, Germany
  • 3DPMC and GAP, University of Geneva, quai Ernest-Ansermet 24, CH-1211 Geneve, Switzerland

  • *Corresponding author; romain.danneau@kit.edu
  • Present address: Microtechnology and Nanoscience MC2, Chalmers University of Technology, 41296 Göteborg, Sweden.

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 82, Iss. 16 — 15 October 2010

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×