Superconductivity in the Rh-based Heusler family MRh2Sn

T. Klimczuk, K. Gofryk, C. H. Wang, J. M. Allred, F. Ronning, W. Sadowski, J.-C. Griveau, E. Colineau, D. Safarik, J. D. Thompson, and R. J. Cava
Phys. Rev. B 82, 134520 – Published 14 October 2010; Retraction Phys. Rev. B 83, 019901 (2011)

Abstract

This article has been retracted: see Phys. Rev. B 83, 019901 (2011)

Superconductivity and structural characterization is reported for the Heusler structure compounds ScRh2Sn, LuRh2Sn, and YRh2Sn. The superconducting Tc’s are 2.0 K, 2.9 K, and 4.1 K, respectively. The electronic contributions to the specific heat and the Debye temperatures are reported, and suggest that the observed trend in Tc is governed primarily by an increase in electron-phonon coupling on going from ScRh2Sn to YRh2Sn. The electron-phonon coupling constant λep and the normalized specific-heat jump ΔC/γTc suggest that the MRh2Sn system evolves from weak coupling to moderate coupling superconductivity.

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  • Received 14 July 2010

DOI:https://doi.org/10.1103/PhysRevB.82.134520

©2010 American Physical Society

Erratum

Retraction: Superconductivity in the Rh-based Heusler family MRh2Sn [Phys. Rev. B 82, 134520 (2010)]

T. Klimczuk, K. Gofryk, C. H. Wang, J. M. Allred, F. Ronning, W. Sadowski, J.-C. Griveau, E. Colineau, D. Safarik, J. D. Thompson, and R. J. Cava
Phys. Rev. B 83, 019901 (2011)

Authors & Affiliations

T. Klimczuk1,2,3, K. Gofryk1, C. H. Wang1,4, J. M. Allred5, F. Ronning1, W. Sadowski3, J.-C. Griveau2, E. Colineau2, D. Safarik1, J. D. Thompson1, and R. J. Cava5

  • 1Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
  • 2Joint Research Center, Institute for Transuranium Elements, European Commission, Postfach 2340, Karlsruhe D-76125, Germany
  • 3Faculty of Applied Physics and Mathematics, Gdansk University of Technology, Narutowicza 11/12, 80-952 Gdansk, Poland
  • 4University of California, Irvine, California 92697, USA
  • 5Department of Chemistry, Princeton University, Princeton, New Jersey 08544, USA

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Issue

Vol. 82, Iss. 13 — 1 October 2010

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