Abstract
We study numerically scattering and transport statistical properties of the one-dimensional Anderson model at the metal-insulator transition described by the power-law banded random matrix (PBRM) model at criticality. Within a scattering approach to electronic transport, we concentrate on the case of a small number of single-channel attached leads. We observe a smooth crossover from localized to delocalized behavior in the average-scattering matrix elements, the conductance probability distribution, the variance of the conductance, and the shot noise power by varying (the effective bandwidth of the PBRM model) from small to large values. We contrast our results with analytic random matrix theory predictions which are expected to be recovered in the limit . We also compare our results for the PBRM model with those for the three-dimensional (3D) Anderson model at criticality, finding that the PBRM model with reproduces well the scattering and transport properties of the 3D Anderson model.
4 More- Received 14 January 2010
DOI:https://doi.org/10.1103/PhysRevB.82.125106
©2010 American Physical Society