Second-order calculation of the local density of states above a nanostructured surface

Felix Rüting, Svend-Age Biehs, Oliver Huth, and Martin Holthaus
Phys. Rev. B 82, 115443 – Published 24 September 2010

Abstract

We have numerically implemented a perturbation series for the scattered electromagnetic fields above rough surfaces, due to Greffet, allowing us to evaluate the local density of states to second order in the surface profile function. We present typical results for thermal near fields of surfaces with regular nanostructures, investigating the relative magnitude of the contributions appearing in successive orders. The method is then employed for estimating the resolution limit of an idealized near-field scanning thermal microscope.

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  • Received 2 February 2010

DOI:https://doi.org/10.1103/PhysRevB.82.115443

©2010 American Physical Society

Authors & Affiliations

Felix Rüting, Svend-Age Biehs*, Oliver Huth, and Martin Holthaus

  • Institut für Physik, Carl von Ossietzky Universität, D-26111 Oldenburg, Germany

  • *Present address: Laboratoire Charles Fabry, Institut d’Optique, CNRS, Université Paris-Sud, Campus Polytechnique, RD128, 91127 Palaiseau Cedex, France.

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Issue

Vol. 82, Iss. 11 — 15 September 2010

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