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Visualizing nanoscale electronic band alignment at the La2/3Ca1/3MnO3/Nb:SrTiO3 interface

TeYu Chien (簡德宇), Jian Liu, Jacques Chakhalian, Nathan P. Guisinger, and John W. Freeland
Phys. Rev. B 82, 041101(R) – Published 2 July 2010

Abstract

Cross-sectional scanning tunneling microscopy and spectroscopy (XSTM/S) were used to map out the band alignment across the complex oxide interface of La2/3Ca1/3MnO3/Nb-doped SrTiO3. By a controlled cross-sectional fracturing procedure, unit-cell high steps persist near the interface between the thin film and the substrate in the noncleavable perovskite materials. The abrupt changes in the mechanical and electronic properties were visualized directly by XSTM/S. Using changes in the density of states as probe by STM, the electronic band alignment across the heterointerface was mapped out providing an approach to directly measure the electronic properties at complex oxide interfaces.

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  • Received 12 May 2010

DOI:https://doi.org/10.1103/PhysRevB.82.041101

©2010 American Physical Society

Authors & Affiliations

TeYu Chien (簡德宇)1,*, Jian Liu2, Jacques Chakhalian2, Nathan P. Guisinger3, and John W. Freeland1

  • 1Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
  • 2Department of Physics, University of Arkansas, Fayetteville, Arkansas 72701, USA
  • 3Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA

  • *tchien@anl.gov

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Vol. 82, Iss. 4 — 15 July 2010

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